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Magazine Name : Ieee Design And Test Of Computers
Year : 1996Volume number : 13Issue:02
Desing And Self-Test For Switched-Current Building Blocks.(Article) Subject:
Author:
Thomas
Olbrich
Andrew
Richardson
page:
10
-
17
Analog Testing With Time Response Parameters.(Article) Subject:
Author:
Ashok
Balivada
Jin
Chen
Jacob A
Abraham
page:
18
-
25
Dc Built-In Self-Test For Linear Analog Circuits.(Article) Subject:
Author:
Naveena
Nagi
Bruce C
Kim
Abhijit
Chatterjee
page:
26
-
33
Real-Time Current Testing For A/D Converters.(Article) Subject:
Author:
Yukiya
Miura
page:
34
-
41
Fpga And Cpld Architectures: A Tutorial.(Article) Subject:
Author:
Stephen
Brown
Jonathan
Rose
page:
42
-
57
Optimizing Power In Asic Behavioral Synthesis.(Article) Subject:
Author:
John P
Knight
Raul San
Martin
page:
58
-
71
An Integrated Cad Environment For Low-Power Design.(Article) Subject:
Author:
Jan M
Rabaey
Renu
Mehra
Paul
Landman
page:
72
-
82