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Magazine Name : Ieee Design And Test Of Computers

Year : 1996 Volume number : 13 Issue: 02

Desing And Self-Test For Switched-Current Building Blocks. (Article)
Subject:
Author: Thomas Olbrich      Andrew Richardson     
page:      10 - 17
Analog Testing With Time Response Parameters. (Article)
Subject:
Author: Ashok Balivada      Jin Chen      Jacob A Abraham     
page:      18 - 25
Dc Built-In Self-Test For Linear Analog Circuits. (Article)
Subject:
Author: Naveena Nagi      Bruce C Kim      Abhijit Chatterjee     
page:      26 - 33
Real-Time Current Testing For A/D Converters. (Article)
Subject:
Author: Yukiya Miura     
page:      34 - 41
Fpga And Cpld Architectures: A Tutorial. (Article)
Subject:
Author: Stephen Brown      Jonathan Rose     
page:      42 - 57
Optimizing Power In Asic Behavioral Synthesis. (Article)
Subject:
Author: John P Knight      Raul San Martin     
page:      58 - 71
An Integrated Cad Environment For Low-Power Design. (Article)
Subject:
Author: Jan M Rabaey      Renu Mehra      Paul Landman     
page:      72 - 82